TY - BOOK TI - Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach AU - Alexe, M. (Marin) AU - Gruverman, A. (Alexei) SN - 3540206620 (alk. paper) PB - Springer-Verlag PP - Berlin ; New York : Springer-Verlag , c2004. PY - 2004 UR - https://library.korea.ac.kr/detail/?cid=CAT000045513161&ctype=m