| 000 | 01048camuu2200289 a 4500 | |
| 001 | 000045715271 | |
| 005 | 20120810154425 | |
| 007 | ta | |
| 008 | 120523s2012 flua b 001 0 eng | |
| 010 | ▼a 2011010401 | |
| 020 | ▼a 9781439818459 (hardcover : alk. paper) | |
| 020 | ▼a 1439818452 (hardcover : alk. paper) | |
| 035 | ▼a (KERIS)BIB000012828019 | |
| 040 | ▼a 241026 ▼c 241026 ▼d 244002 | |
| 082 | 0 0 | ▼a 004.1 ▼2 22 |
| 084 | ▼a 004.1 ▼2 DDCK | |
| 090 | ▼a 004.1 ▼b M689 | |
| 245 | 0 0 | ▼a Model-based testing for embedded systems / ▼c edited by Justyna Zander, Ina Schieferdecker, and Pieter J. Mosterman. |
| 260 | ▼a Boca Raton : ▼b CRC Press, ▼c c2012. | |
| 300 | ▼a xxvii, 660 p. : ▼b ill. ; ▼c 26 cm. | |
| 490 | 0 | ▼a Computational analysis, synthesis, and design of dynamic systems |
| 504 | ▼a Includes bibliographical references and index. | |
| 650 | 0 | ▼a Embedded computer systems ▼x Testing. |
| 700 | 1 | ▼a Zander, Justyna. |
| 700 | 1 | ▼a Schieferdecker, Ina. |
| 700 | 1 | ▼a Mosterman, Pieter J. |
소장정보
| No. | 소장처 | 청구기호 | 등록번호 | 도서상태 | 반납예정일 | 예약 | 서비스 |
|---|---|---|---|---|---|---|---|
| No. 1 | 소장처 세종학술정보원/과학기술실/ | 청구기호 004.1 M689 | 등록번호 151309890 | 도서상태 대출가능 | 반납예정일 | 예약 | 서비스 |
컨텐츠정보
저자소개
Ina Schieferdecker(엮은이)
Justyna Zander(엮은이)
목차
Part I: Introduction
A Taxonomy of Model-Based Testing for Embedded Systems from Multiple Industry Domains, J. Zander, I. Schieferdecker, and P.J. Mosterman
Behavioral System Models versus Models of Testing Strategies in Functional Test Generation, A. Huima
Test Framework Architectures for Model-Based Embedded System Testing, S.P. Masticola and M. Gall
Part II: Automatic Test Generation
Automatic Model-Based Test Generation from UML State Machines, S. Weissleder and H. Schlingloff
Automated Statistical Testing for Embedded Systems, J.H. Poore, L. Lin, R. Eschbach, and T. Bauer
How to Design Extended Finite State Machine Test Models in Java, M. Utting
Automatic Testing of LUSTRE/SCADE Programs, V. Papailiopoulou, B. Seljimi, and I. Parissis
Test Generation Using Symbolic Animation of Models, F. Dadeau, F. Peureux, B. Legeard, R. Tissot, J. Julliand, P.-A. Masson, and F. Bouquet
Part III: Integration and Multi-level Testing
Model-Based Integration Testing with Communication Sequence Graphs, F. Belli, A. Hollmann, and S. Padberg
A Model-Based View onto Testing: Criteria for the Derivation of Entry Tests for Integration Testing, M. Broy and A. Pretschner
Multilevel Testing for Embedded Systems, A. Marrero Perez and S. Kaiser
Model-Based X-in-the-Loop Testing, J. Grossmann, P. Makedonski, H.-W. Wiesbrock, J. Svacina, I. Schieferdecker, and J. Grabowski
Part IV: Specific Approaches
A Survey of Model-Based Software Product Lines Testing, S. Oster, A. Wubbeke, G. Engels, and A. Schorr
Model-Based Testing of Hybrid Systems, T. Dang
Reactive Testing of Nondeterministic Systems by Test Purpose-Directed Tester, J. Vain, A. Kull, M. Kaaramees, M. Markvardt, and K. Raiend
Model-Based Passive Testing of Safety-Critical Components, S. Gruner and B. Watson
Part V: Testing in Industry
Applying Model-Based Testing in the Telecommunication Domain, F. Abbors, V.-M. Aho, J. Koivulainen, R. Teittinen, and D. Truscan
Model-Based GUI Testing of Smartphone Applications: Case S60™ and Linux®, A. Jaaskelainen, T. Takala, and M. Katara
Model-Based Testing in Embedded Automotive Systems, P. Skruch, M. Panek, and B. Kowalczyk
Part VI: Testing at the Lower Levels of Development
Testing-Based Translation Validation of Generated Code, M. Conrad
Model-Based Testing of Analog Embedded Systems Components, L. Barford
Dynamic Verification of SystemC Transactional Models, L. Pierre and L. Ferro
Index
정보제공 :