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Model-based testing for embedded systems

Model-based testing for embedded systems

자료유형
단행본
개인저자
Zander, Justyna. Schieferdecker, Ina. Mosterman, Pieter J.
서명 / 저자사항
Model-based testing for embedded systems / edited by Justyna Zander, Ina Schieferdecker, and Pieter J. Mosterman.
발행사항
Boca Raton :   CRC Press,   c2012.  
형태사항
xxvii, 660 p. : ill. ; 26 cm.
총서사항
Computational analysis, synthesis, and design of dynamic systems
ISBN
9781439818459 (hardcover : alk. paper) 1439818452 (hardcover : alk. paper)
서지주기
Includes bibliographical references and index.
일반주제명
Embedded computer systems -- Testing.
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001 000045715271
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008 120523s2012 flua b 001 0 eng
010 ▼a 2011010401
020 ▼a 9781439818459 (hardcover : alk. paper)
020 ▼a 1439818452 (hardcover : alk. paper)
035 ▼a (KERIS)BIB000012828019
040 ▼a 241026 ▼c 241026 ▼d 244002
082 0 0 ▼a 004.1 ▼2 22
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090 ▼a 004.1 ▼b M689
245 0 0 ▼a Model-based testing for embedded systems / ▼c edited by Justyna Zander, Ina Schieferdecker, and Pieter J. Mosterman.
260 ▼a Boca Raton : ▼b CRC Press, ▼c c2012.
300 ▼a xxvii, 660 p. : ▼b ill. ; ▼c 26 cm.
490 0 ▼a Computational analysis, synthesis, and design of dynamic systems
504 ▼a Includes bibliographical references and index.
650 0 ▼a Embedded computer systems ▼x Testing.
700 1 ▼a Zander, Justyna.
700 1 ▼a Schieferdecker, Ina.
700 1 ▼a Mosterman, Pieter J.

소장정보

No. 소장처 청구기호 등록번호 도서상태 반납예정일 예약 서비스
No. 1 소장처 세종학술정보원/과학기술실/ 청구기호 004.1 M689 등록번호 151309890 도서상태 대출가능 반납예정일 예약 서비스 C

컨텐츠정보

저자소개

Ina Schieferdecker(엮은이)

Justyna Zander(엮은이)

정보제공 : Aladin

목차

Part I: Introduction

A Taxonomy of Model-Based Testing for Embedded Systems from Multiple Industry Domains, J. Zander, I. Schieferdecker, and P.J. Mosterman

Behavioral System Models versus Models of Testing Strategies in Functional Test Generation, A. Huima

Test Framework Architectures for Model-Based Embedded System Testing, S.P. Masticola and M. Gall

 

Part II: Automatic Test Generation

Automatic Model-Based Test Generation from UML State Machines, S. Weissleder and H. Schlingloff

Automated Statistical Testing for Embedded Systems, J.H. Poore, L. Lin, R. Eschbach, and T. Bauer

How to Design Extended Finite State Machine Test Models in Java, M. Utting

Automatic Testing of LUSTRE/SCADE Programs, V. Papailiopoulou, B. Seljimi, and I. Parissis

Test Generation Using Symbolic Animation of Models, F. Dadeau, F. Peureux, B. Legeard, R. Tissot, J. Julliand, P.-A. Masson, and F. Bouquet

 

Part III: Integration and Multi-level Testing

Model-Based Integration Testing with Communication Sequence Graphs, F. Belli, A. Hollmann, and S. Padberg

A Model-Based View onto Testing: Criteria for the Derivation of Entry Tests for Integration Testing, M. Broy and A. Pretschner

Multilevel Testing for Embedded Systems, A. Marrero Perez and S. Kaiser

Model-Based X-in-the-Loop Testing, J. Grossmann, P. Makedonski, H.-W. Wiesbrock, J. Svacina, I. Schieferdecker, and J. Grabowski

 

Part IV: Specific Approaches

A Survey of Model-Based Software Product Lines Testing, S. Oster, A. Wubbeke, G. Engels, and A. Schorr

Model-Based Testing of Hybrid Systems, T. Dang

Reactive Testing of Nondeterministic Systems by Test Purpose-Directed Tester, J. Vain, A. Kull, M. Kaaramees, M. Markvardt, and K. Raiend

Model-Based Passive Testing of Safety-Critical Components, S. Gruner and B. Watson

 

Part V: Testing in Industry

Applying Model-Based Testing in the Telecommunication Domain, F. Abbors, V.-M. Aho, J. Koivulainen, R. Teittinen, and D. Truscan

Model-Based GUI Testing of Smartphone Applications: Case S60™ and Linux®, A. Jaaskelainen, T. Takala, and M. Katara

Model-Based Testing in Embedded Automotive Systems, P. Skruch, M. Panek, and B. Kowalczyk

 

Part VI: Testing at the Lower Levels of Development

Testing-Based Translation Validation of Generated Code, M. Conrad

Model-Based Testing of Analog Embedded Systems Components, L. Barford

Dynamic Verification of SystemC Transactional Models, L. Pierre and L. Ferro

 

Index


정보제공 : Aladin

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