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Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach

Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach (6회 대출)

자료유형
단행본
개인저자
Alexe, M. (Marin) Gruverman, A. (Alexei)
서명 / 저자사항
Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach / M. Alexe, A. Gruverman, eds.
발행사항
Berlin ;   New York :   Springer-Verlag ,   c2004.  
형태사항
xiii, 282 p. : ill. (some col.) ; 24 cm.
총서사항
Nanoscience and technology
ISBN
3540206620 (alk. paper) 9783540206620
서지주기
Includes bibliographical references and index.
일반주제명
Nanostructured materials. Nanotechnology.
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010 ▼a 2004040666
020 ▼a 3540206620 (alk. paper)
020 ▼a 9783540206620
035 ▼a (KERIS)REF000009945919
040 ▼a DLC ▼c DLC ▼d DLC ▼d 211009
042 ▼a pcc
050 0 0 ▼a TA418.9.N35 ▼b N3445 2004
082 0 0 ▼a 620/.5 ▼2 22
090 ▼a 620.5 ▼b N186997
245 0 0 ▼a Nanoscale characterisation of ferroelectric materials : ▼b scanning probe microscopy approach / ▼c M. Alexe, A. Gruverman, eds.
260 ▼a Berlin ; ▼a New York : ▼b Springer-Verlag , ▼c c2004.
300 ▼a xiii, 282 p. : ▼b ill. (some col.) ; ▼c 24 cm.
490 1 ▼a Nanoscience and technology
504 ▼a Includes bibliographical references and index.
650 0 ▼a Nanostructured materials.
650 0 ▼a Nanotechnology.
700 1 ▼a Alexe, M. ▼q (Marin)
700 1 ▼a Gruverman, A. ▼q (Alexei)
830 0 ▼a Nanoscience and technology.
945 ▼a KINS

소장정보

No. 소장처 청구기호 등록번호 도서상태 반납예정일 예약 서비스
No. 1 소장처 과학도서관/Sci-Info(2층서고)/ 청구기호 620.5 N186997 등록번호 121182840 도서상태 대출가능 반납예정일 예약 서비스 B M
No. 2 소장처 과학도서관/Sci-Info(2층서고)/ 청구기호 620.5 N186997 등록번호 121184555 도서상태 대출가능 반납예정일 예약 서비스 B M

컨텐츠정보

목차

1 Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces.- 2 Challenges in the Analysis of the Local Piezoelectric Response.- 3 Electrical Characterization of Nanoscale Ferroelectric Structures.- 4 Nanoscale Optical Probes of Ferroelectric Materials.- 5 Scanning Nonlinear Dielectric Microscopy for Investigation of Ferroelectric Polarization.- 6 Nanoscale Piezoelectric Phenomena in Epitaxial PZT Thin Films.- 7 Scanning Probe Microscopy of Ferroelectric Domains near Phase Transitions.- 8 Nanodomain Engineering in Ferroelectric Crystals Using High Voltage Atomic Force Microscopy.- 9 Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in PZT Thin Films.


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